Catalog

Record Details

Catalog Search



Thermal assessment and in-situ monitoring of insulated gate bipolar transistors in power electronic modules : preprint / Erick Gutierrez [and three others].

Image of item

Record details

  • Physical Description: 1 online resource (7 pages) : illustrations (chiefly color).
  • Publisher: Golden, CO : National Renewable Energy Laboratory, 2020.

Content descriptions

General Note:
"February 2020."
"Presented at ASME 2019 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems (IPACK2019), Anaheim, California, October 7-9, 2019"--Page 1 of cover.
Bibliography, etc. Note:
Includes bibliographical references (page 6-7).
Funding Information Note:
DE-AC36-08GO28308
Source of Description Note:
Description based on online resource; title from PDF title page (NREL, viewed on August 5, 2020).
Subject: Insulated gate bipolar transistors > United States > Observations.
Thermal conductivity > United States > Observations.

Additional Resources