End-to-end demonstration of the Quality Information Framework (QIF) standard at the International Manufacturing Technology Show (IMTS) 2014 / Hui-Min Huang; John Michaloski; Daniel Campbell; Robert Stone; Thomas Kramer; Curtis Brown; Robert Brown; Gavrail Tatarliev.
- Physical Description: 1 online resource (19 pages) : illustrations (chiefly color).
- Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2016.
Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
Title from PDF title page (viewed May 31, 2016).
|Bibliography, etc. Note:||
Includes bibliographical references.
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