A rational foundation for software metrology / David Flater; Paul E. Black; Elizabeth Fong; Raghy Kacker; Vadim Okum; Stephen Wood; D. Richard Kuhn.
- Physical Description: 1 online resource (ii, 38 pages) : illustrations (chiefly color).
- Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2016.
Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
Title from PDF title page (viewed January 31, 2016).
|Bibliography, etc. Note:||
Includes bibliographical references.
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