Catalog

Record Details

Catalog Search



A rational foundation for software metrology / David Flater; Paul E. Black; Elizabeth Fong; Raghy Kacker; Vadim Okum; Stephen Wood; D. Richard Kuhn.

Flater, David. (Author). Black, Paul E. (Added Author). Flater, David. (Added Author). Fong, Elizabeth. (Added Author). Kacker, Raghy. (Added Author). Kuhn, D. Richard. (Added Author). Okum, Vadim. (Added Author). Wood, Stephen. (Added Author). National Institute of Standards and Technology (U.S.) (Added Author).
Image of item

Series Information

NISTIR ; 8101.

Record details

  • Physical Description: 1 online resource (ii, 38 pages) : illustrations (chiefly color).
  • Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2016.

Content descriptions

General Note:
Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
January 2016.
Title from PDF title page (viewed January 31, 2016).
Bibliography, etc. Note:
Includes bibliographical references.
Subject: Computer software.
Metrology.

Additional Resources