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Simulated sinewave testing of data acquisition systems using sine fitting and discrete fourier transform methods part 1 : frequency offset, random, quantization, and jitter noise / Jon Geist; M. Yaqub Afridi.

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Series Information

NISTIR ; 8073.

Record details

  • Physical Description: 1 online resource (39 pages) : illustrations (color).
  • Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2015.

Content descriptions

General Note:
Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
July 2015.
Title from PDF title page (viewed July 30, 2015).
Bibliography, etc. Note:
Includes bibliographical references.
Subject: Data collection systems.
Frequencies of oscillating systems.

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