Simulated sinewave testing of data acquisition systems using sine fitting and discrete fourier transform methods part 1 : frequency offset, random, quantization, and jitter noise / Jon Geist; M. Yaqub Afridi.
- Physical Description: 1 online resource (39 pages) : illustrations (color).
- Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2015.
Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
Title from PDF title page (viewed July 30, 2015).
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|Subject:||Data collection systems.
Frequencies of oscillating systems.