Record Details

Catalog Search

Method for measuring axis orthogonality in MEMS accelerometers / Craig D. McGray; Yaqub Afridi; Jon Geist.

Image of item

Series Information

NISTIR ; 7925.

Record details

  • Physical Description: 1 online resource (11 pages) : illustrations (some color).
  • Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2013.

Content descriptions

General Note:
"July 2013."
Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
Title from PDF title page (viewed July 16, 2013).
Bibliography, etc. Note:
Includes bibliographical references.
Subject: Accelerometers.
Axis orthogonality.

Additional Resources