Method for measuring axis orthogonality in MEMS accelerometers / Craig D. McGray; Yaqub Afridi; Jon Geist.
- Physical Description: 1 online resource (11 pages) : illustrations (some color).
- Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2013.
Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
Title from PDF title page (viewed July 16, 2013).
|Bibliography, etc. Note:||
Includes bibliographical references.
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