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A review of test artifacts for additive manufacturing / Shawn Moylan; April Cooke; Kevin Jurrens; John Slotwinski; M. Alkan Donmez.

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Series Information

NISTIR ; 7858.

Record details

  • Physical Description: 1 online resource.
  • Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2012.

Content descriptions

General Note:
Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
Title from PDF title page.
Bibliography, etc. Note:
Includes bibliographical references.

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