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ELFT-EFS Evaluation of Latent Fingerprint Technologies : Extended Feature Sets [evaluation #1] / M. Indovina; R. A. Hicklin; G. I. Kiebuzinski.

Indovina, M. (Author). Hicklin, R. Austin. (Added Author). Indovina, M. (Added Author). Kiebuzinski, G. I. (Added Author). National Institute of Standards and Technology (U.S.) (Added Author).
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NISTIR ; 7775.

Record details

  • Physical Description: 1 online resource.
  • Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2011.

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Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
Title from PDF title page (viewed December 31, 2015).
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Includes bibliographical references.

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