Overview of the multiple biometrics grand challenge / P. J. Phillips; H. A. Sahibzada; P. J. Flynn; K. W. Bowyer; A. O'Toole; S. Weimer; J. R. Beveridge; B. Draper; D. Bolme; G. H. Givens; Y. M. Lui; J. A. Scallan; W. T. Scruggs.
- Physical Description: 1 online resource.
- Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2009.
Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
Title from PDF title page.
|Bibliography, etc. Note:||
Includes bibliographical references.