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Extending the notion of quality from physical metrology to information and sustainability / Gaurav Ameta; Sudarsan Rachuri; Xenia Fiorentini; Mahesh Mani; Steven J. Fenves; Kevin W. Lyons; Ram D. Sriram.

Ameta, Gaurav. (Author). Ameta, Gaurav. (Added Author). Fenves, Steven J. (Steven Joseph) (Added Author). Fiorentini, Xenia. (Added Author). Lyons, Kevin W. (Added Author). Mani, Mahesh. (Added Author). Rachuri, Sudarsan. (Added Author). Sriram, Ram D., 1957- (Added Author). National Institute of Standards and Technology (U.S.) (Added Author).
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NISTIR ; 7517.

Record details

  • Physical Description: 1 online resource.
  • Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2008.

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