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Extending the notion of quality from physical metrology to information and sustainability / Gaurav Ameta; Sudarsan Rachuri; Xenia Fiorentini; Mahesh Mani; Steven J. Fenves; Kevin W. Lyons; Ram D. Sriram.

Ameta, Gaurav. (Author). Ameta, Gaurav. (Added Author). Fenves, Steven J. (Steven Joseph) (Added Author). Fiorentini, Xenia. (Added Author). Lyons, Kevin W. (Added Author). Mani, Mahesh. (Added Author). Rachuri, Sudarsan. (Added Author). Sriram, Ram D., 1957- (Added Author). National Institute of Standards and Technology (U.S.) (Added Author).
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Series Information

NISTIR ; 7517.

Record details

  • Physical Description: 1 online resource.
  • Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2008.

Content descriptions

General Note:
2008.
Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
Title from PDF title page.
Bibliography, etc. Note:
Includes bibliographical references.

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