Measuring and assessing the consequences of technology and innovation for affordability of housing : proceedings of the NIST - PATH Workshop / William I. Whiddon; David B. Hattis; Chi J. Leng.
- Physical Description: 1 online resource.
- Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2004.
Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
Title from PDF title page.
|Bibliography, etc. Note:||
Includes bibliographical references.