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Measuring and assessing the consequences of technology and innovation for affordability of housing : proceedings of the NIST - PATH Workshop / William I. Whiddon; David B. Hattis; Chi J. Leng.

Whiddon, William I. (Author). Hattis, David B. (Added Author). Leng, Chi J. (Added Author). Whiddon, William I. (Added Author). National Institute of Standards and Technology (U.S.) (Added Author).
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Series Information

NISTIR ; 7064.

Record details

  • Physical Description: 1 online resource.
  • Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2004.

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Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
Title from PDF title page.
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Includes bibliographical references.

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