Analysis of dimensional metrology standards / John Evans; Simon Frechette; John Horst; Hui Huang; Thomas Kramer; Elena Messina; Fred Proctor; Bill Rippey; Harry Scott; Ted Vorburger; Al Wavering.
- Physical Description: 1 online resource.
- Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2001.
Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
Title from PDF title page.
|Bibliography, etc. Note:||
Includes bibliographical references.