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Analysis of dimensional metrology standards / John Evans; Simon Frechette; John Horst; Hui Huang; Thomas Kramer; Elena Messina; Fred Proctor; Bill Rippey; Harry Scott; Ted Vorburger; Al Wavering.

Evans, John. (Author). Evans, John. (Added Author). Frechette, Simon. (Added Author). Horst, John. (Added Author). Huang, Hui. (Added Author). Kramer, Thomas. (Added Author). Messina, E. R. (Elena R.) (Added Author). Proctor, Frederick M. (Added Author). Rippey, Bill. (Added Author). Scott, Harry. (Added Author). Vorburger, Ted. (Added Author). Wavering, Al. (Added Author). National Institute of Standards and Technology (U.S.) (Added Author).
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Series Information

NISTIR ; 6847.

Record details

  • Physical Description: 1 online resource.
  • Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2001.

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Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
Title from PDF title page.
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Includes bibliographical references.

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