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Evaluation of dielectric properties of polymer thin-film materials for application in embedded capacitance / Jan Obrzut; C. K. Chiang; R. Popielarz; R. Nozaki.

Obrzut, Jan. (Author). Chiang, C. K. (Added Author). Nozaki, R. (Added Author). Obrzut, Jan. (Added Author). Popielarz, R. (Added Author). National Institute of Standards and Technology (U.S.) (Added Author).
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NISTIR ; 6537.

Record details

  • Physical Description: 1 online resource.
  • Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2000.

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