XRAYL : a powder diffraction profile refinement program / C. R. Hubbard; J. M. Stewart; Y. Zhang; B. Morosin; E. L. Venturini.
- Physical Description: 1 online resource.
- Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1988.
Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
Title from PDF title page.
|Bibliography, etc. Note:||
Includes bibliographical references.