Survey sample design for microfilm inspection at the National Archives / Keith R. Eberhardt.
- Physical Description: 1 online resource.
- Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1988.
Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
Title from PDF title page.
|Bibliography, etc. Note:||
Includes bibliographical references.