Fast risetime reverse bias pulse failures in SiC PN junction diodes / Philip G. Nuedeck, Christian Faziz, James D. Parsons.
- Physical Description: 1 online resource (6 pages) : illustrations.
- Publisher: Cleveland, Ohio : National Aeronautics and Space Administration, Lewis Research Center, June 1996.
|General Note:|| Title from title screen (viewed July 12, 2016).
"June 1996"--Report documentation page.
"Prepared for the Third International High Temperature Electronics Conference sponsored by the Sandia National Laboratories, Albuquerque, New Mexico, June 9-14, 1996."
"Performing organization: National Aeronautics and Space Administration, Lewis Research Center"--Report documentation page.
|Bibliography, etc. Note:|| Includes bibliographical references (page 6).
|Funding Information Note:|| Sponsored by the National Aeronautics and Space Administration WU-505--62-50 E-10317
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