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Characterization of high Ge content SiGe heterostructures and graded alloy layers using spectroscopic ellipsometry / A.R. Heyd, S.A. Alterovitz, E.T. Croke.

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Available copies

  • 1 of 1 copy available at Evergreen Indiana.

Current holds

0 current holds with 1 total copy.

Series Information

NASA technical memorandum ; 112114.
Location Call Number / Copy Notes Barcode Shelving Location Status Due Date
Indiana State Library - Indianapolis NAS 1.15:112114 (Text) 842706-1001 General Federal documents Available -

Record details

  • Physical Description: 1 volume.
  • Publisher: [Washington, D.C.] : [National Aeronautics and Space Administration] ; [1995]

Content descriptions

General Note:
Shipping list no.: 97-0960-M.
Reproduction Note:
Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1995] 1 microfiche.

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