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Characterization of SiGe/Ge heterostructures and graded layers using variable angle spectroscopic ellipsometry / A.R. Heyd ... [and others].

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Available copies

  • 1 of 1 copy available at Evergreen Indiana.

Current holds

0 current holds with 1 total copy.

Series Information

NASA technical memorandum ; 111685.
Location Call Number / Copy Notes Barcode Shelving Location Status Due Date
Indiana State Library - Indianapolis NAS 1.15:111685 (Text) 818384-1001 General Federal documents Available -

Record details

  • Physical Description: 1 volume.
  • Publisher: [Washington, D.C.] : [National Aeronautics and Space Administration] ; [1996]

Content descriptions

General Note:
Shipping list no.: 98-0791-M.
Reproduction Note:
Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1997] 1 microfiche.

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