Catalog

Record Details

Catalog Search



Method and apparatus for measuring minority carrier lifetime in a direct band-gap semiconductor.

Image of item

Available copies

  • 1 of 1 copy available at Evergreen Indiana.

Current holds

0 current holds with 1 total copy.

Series Information

NASA case ; NPO-16337-1-CU.
Location Call Number / Copy Notes Barcode Shelving Location Status Due Date
Indiana State Library - Indianapolis NAS 1.71:NPO-16337-1-CU (Text) isl766527-1001 General Federal documents Available -

Record details

  • Physical Description: 1 volume.
  • Publisher: [Washington, D.C.] : [National Aeronautics and Space Administration], [1984]

Content descriptions

General Note:
Title from prelim. p. [2].
Distributed to depository libraries in microfiche; shipping list no. not available.
"Date: October 19, 1984; filing date: 12/18/84."
Inventors: Oldwig von Roos; contractor: Jet Propulsion Laboratory.
Reproduction Note:
Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1984] 1 microfiche GovDoc Classification No. on header: NAS 1.71:NPO-16337-1.
Subject: Semiconductors > Effect of radiation on.
Wide gap semiconductors.

Additional Resources