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Flaw imaging and ultrasonic techniques for characterizing sintered silicon carbide / George Y. Baaklini and Phillip B. Abel.

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Available copies

  • 1 of 1 copy available at Evergreen Indiana.

Current holds

0 current holds with 1 total copy.

Series Information

NASA technical memorandum ; 100177.
Location Call Number / Copy Notes Barcode Shelving Location Status Due Date
Indiana State Library - Indianapolis NAS 1.15:100177 (Text) 633800-1001 General Federal documents Available -

Record details

  • Physical Description: 1 volume.
  • Publisher: [Washington, DC] : National Aeronautics and Space Administration ; [1987]

Content descriptions

General Note:
Distributed to depository libraries in microfiche.
Reproduction Note:
Microfiche. [Washington, D.C.? : National Aeronautics and Space Administration], 1988. 1 microfiche ; 11 x 15 cm.
Subject: Quality assurance > United States.
Nondestructive testing.

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