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DISTRIB I : an impurity redistribution computer program  Cover Image Book Book

DISTRIB I : an impurity redistribution computer program / David Gilsinn, Institute for Computer Sciences and Technology, National Bureau of Standards, and Richard Kraft, Center for Applied Mathematics, National Engineering Laboratory, National Bureau of Standards.

Record details

  • Physical Description: viii, 122 pages : illustrations ; 26 cm.
  • Publisher: Washington : Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U. S. Govt. Print. Off., 1979.

Content descriptions

General Note:
This activity was supported by the Defense Advanced Research Projects Agency.
Subject: Silicon.
Oxidation.

Available copies

  • 1 of 1 copy available at Evergreen Indiana.

Holds

  • 0 current holds with 1 total copy.
Show Only Available Copies
Location Call Number / Copy Notes Barcode Shelving Location Status Due Date
Indiana State Library - Indianapolis C 13.10:400-57 (Text) 410645-1001 General Federal documents Available -

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LDR 01732nam a2200361 i 4500
001(Sirsi) o04767710
003OCLC
008790320s1979 dcua f000 0 eng d
010 . ‡a 79600002
020 . ‡c$3.00
037 . ‡b20402
040 . ‡aTRL ‡erda ‡cTRL ‡dGPO ‡dMvI
074 . ‡a247
0860 . ‡aC 13.10:400-57
1001 . ‡aGilsinn, David, ‡d1943- ‡0(EG-IN)1016614
24510. ‡aDISTRIB I : ‡ban impurity redistribution computer program / ‡cDavid Gilsinn, Institute for Computer Sciences and Technology, National Bureau of Standards, and Richard Kraft, Center for Applied Mathematics, National Engineering Laboratory, National Bureau of Standards.
264 1. ‡aWashington : ‡bDept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U. S. Govt. Print. Off., ‡c1979.
300 . ‡aviii, 122 pages : ‡billustrations ; ‡c26 cm.
336 . ‡atext ‡btxt ‡2rdacontent
337 . ‡aunmediated ‡bn ‡2rdamedia
338 . ‡avolume ‡bnc ‡2rdacarrier
4901 . ‡aNBS special publication ; ‡v400-57.
4901 . ‡aSemiconductor measurement technology
500 . ‡aThis activity was supported by the Defense Advanced Research Projects Agency.
650 0. ‡aSilicon. ‡0(EG-IN)638790
650 0. ‡aOxidation. ‡0(EG-IN)597871
7001 . ‡aKraft, Richard, ‡eauthor. ‡0(EG-IN)1016613
7102 . ‡aInstitute for Computer Sciences and Technology. ‡0(EG-IN)1038197
7102 . ‡aCenter for Applied Mathematics (U.S.) ‡0(EG-IN)1125538
7101 . ‡aUnited States. ‡bDefense Advanced Research Projects Agency. ‡0(EG-IN)988893
830 0. ‡aNBS special publication ‡0(DLC)1179836
830 0. ‡aSemiconductor measurement technology. ‡0(EG-IN)1181216
901 . ‡a(Sirsi) o04767710 ‡bOCLC ‡c16985298 ‡tbiblio

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