LDR
| 01732nam a2200361 i 4500 |
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001 | (Sirsi) o04767710 |
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003 | OCLC |
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008 | 790320s1979 dcua f000 0 eng d |
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010 | | . |
‡a 79600002 |
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020 | | . |
‡c$3.00 |
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037 | | . |
‡b20402 |
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040 | | . |
‡aTRL
‡erda
‡cTRL
‡dGPO
‡dMvI |
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074 | | . |
‡a247 |
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086 | 0 | . |
‡aC 13.10:400-57 |
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100 | 1 | . |
‡aGilsinn, David,
‡d1943-
‡0(EG-IN)1016614 |
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245 | 1 | 0. |
‡aDISTRIB I :
‡ban impurity redistribution computer program /
‡cDavid Gilsinn, Institute for Computer Sciences and Technology, National Bureau of Standards, and Richard Kraft, Center for Applied Mathematics, National Engineering Laboratory, National Bureau of Standards. |
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264 | | 1. |
‡aWashington :
‡bDept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U. S. Govt. Print. Off.,
‡c1979. |
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300 | | . |
‡aviii, 122 pages :
‡billustrations ;
‡c26 cm. |
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336 | | . |
‡atext
‡btxt
‡2rdacontent |
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337 | | . |
‡aunmediated
‡bn
‡2rdamedia |
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338 | | . |
‡avolume
‡bnc
‡2rdacarrier |
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490 | 1 | . |
‡aNBS special publication ;
‡v400-57. |
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490 | 1 | . |
‡aSemiconductor measurement technology |
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500 | | . |
‡aThis activity was supported by the Defense Advanced Research Projects Agency. |
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650 | | 0. |
‡aSilicon.
‡0(EG-IN)638790 |
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650 | | 0. |
‡aOxidation.
‡0(EG-IN)597871 |
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700 | 1 | . |
‡aKraft, Richard,
‡eauthor.
‡0(EG-IN)1016613 |
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710 | 2 | . |
‡aInstitute for Computer Sciences and Technology.
‡0(EG-IN)1038197 |
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710 | 2 | . |
‡aCenter for Applied Mathematics (U.S.)
‡0(EG-IN)1125538 |
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710 | 1 | . |
‡aUnited States.
‡bDefense Advanced Research Projects Agency.
‡0(EG-IN)988893 |
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830 | | 0. |
‡aNBS special publication
‡0(DLC)1179836 |
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830 | | 0. |
‡aSemiconductor measurement technology.
‡0(EG-IN)1181216 |
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901 | | . |
‡a(Sirsi) o04767710
‡bOCLC
‡c16985298
‡tbiblio |
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