ARPA/NBS workshop III : test patterns for integrated circuits / Harry A. Schafft, editor ; Electronic Technology Division.
- 1 of 1 copy available at Evergreen Indiana.
0 current holds with 1 total copy.
|Location||Call Number / Copy Notes||Barcode||Shelving Location||Status||Due Date|
|Indiana State Library - Indianapolis||C 13.10:400-15 (Text)||366138-1001||General Federal documents||Available||-|
- Physical Description: v, 46. 1 unnumbered page : illustrations ; 26 cm.
- Publisher: Washington : U.S. Dept. of Commerce, National Bureau of Standards, Institute for Applied Technology, Electronic Technology Division : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1976.
"This activity was supported by the Defense Advanced Research Projects Agency under ARPA order 2397, Program code 5D10, and the National Bureau of Standards."
Contains synopses of talks and discussions periods, and describes the results of the third workshop in the ARPA/NBS series."
|Bibliography, etc. Note:||
Bibliography: page 46.
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