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ARPA/NBS workshop III : test patterns for integrated circuits / Harry A. Schafft, editor ; Electronic Technology Division.

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Available copies

  • 1 of 1 copy available at Evergreen Indiana.

Current holds

0 current holds with 1 total copy.

Series Information

Semiconductor measurement technology.
NBS special publication
Location Call Number / Copy Notes Barcode Shelving Location Status Due Date
Indiana State Library - Indianapolis C 13.10:400-15 (Text) 366138-1001 General Federal documents Available -

Record details

  • Physical Description: v, 46. 1 unnumbered page : illustrations ; 26 cm.
  • Publisher: Washington : U.S. Dept. of Commerce, National Bureau of Standards, Institute for Applied Technology, Electronic Technology Division : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1976.

Content descriptions

General Note:
CODEN: XNBSAV
"This activity was supported by the Defense Advanced Research Projects Agency under ARPA order 2397, Program code 5D10, and the National Bureau of Standards."
Contains synopses of talks and discussions periods, and describes the results of the third workshop in the ARPA/NBS series."
Bibliography, etc. Note:
Bibliography: page 46.
Subject: Integrated circuits > Testing > Congresses.
Electronic industries > Quality control > Congresses.
Automatic data collection systems > Congresses.

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